Abstract
The reliability of the power semiconductor device for a hybrid car’s motor driver was verified by clarifying the relationship between the unit life characteristics and vehicle usage environment in terms of electric current and heat generation temperature. A reliability of 99.915% or more and a shape parameter (m) of 5.5 or more were obtained. Further, an evaluation method for durability and reliability was established.
References
- (1) Tadashi Ohsawa: Denshi zairyou no handazuke gijyutu, Kogyo Chosakai Publishing Co., Ltd., Tokyo, p.304(1998) (Written in Japanese)
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Article of Honda R&D Technical Review Vol.12 No.1 (73 - 78)
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Sadao SHINOHARA, Shuuji KATOU, Hiroaki TAKANOHASHI, Fumio ANRAKU.
Evaluation of the Durability and Reliability of the Power Semiconductor Device for a Hybrid Car’s Motor Driver
Honda R&D Technical Review Vol.12 No.1 pp.(73 - 78)2000.
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